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An Artificial Intelligence Approach to Test Generation - The Springer International Series in Engineering and Computer Science Narinder Singh Softcover reprint of the original 1st ed. 1987 edition
An Artificial Intelligence Approach to Test Generation - The Springer International Series in Engineering and Computer Science
Narinder Singh
I am indebted to my thesis advisor, Michael Genesereth, for his guidance, inspiration, and support which has made this research possible. This research was supported by Schlumberger Palo Alto Research (previously Fairchild Laboratory for Artificial Intelligence).
194 pages, biography
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 5 de octubre de 2011 |
| ISBN13 | 9781461291831 |
| Editores | Springer-Verlag New York Inc. |
| Páginas | 194 |
| Dimensiones | 155 × 235 × 11 mm · 303 g |
| Lengua | Inglés |
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