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Rapid Reliability Assessment of VLSICs A.P. Dorey Softcover reprint of the original 1st ed. 1990 edition
Rapid Reliability Assessment of VLSICs
A.P. Dorey
The increasing application of integrated circuits in situations where high reliability is needed places a requirement on the manufacturer to use methods of testing to eliminate devices that may fail on service.
212 pages, black & white illustrations
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 8 de marzo de 2012 |
| ISBN13 | 9781461278795 |
| Editores | Springer-Verlag New York Inc. |
| Páginas | 212 |
| Dimensiones | 170 × 244 × 12 mm · 349 g |
| Lengua | Inglés |