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Evaluation of Advanced Semiconductor Materials by Electron Microscopy - NATO Science Series B David Cherns Softcover reprint of the original 1st ed. 1989 edition
Evaluation of Advanced Semiconductor Materials by Electron Microscopy - NATO Science Series B
David Cherns
With these developments in mind, an application was made to the NATO Science Committee in late summer 1987 to fund an Advanced Research Work shop to review the electron microscopy of advanced semiconductors.
412 pages, biography
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 13 de octubre de 2011 |
| ISBN13 | 9781461278504 |
| Editores | Springer-Verlag New York Inc. |
| Páginas | 412 |
| Dimensiones | 170 × 244 × 22 mm · 680 g |
| Lengua | Inglés |
| Editor | Cherns, David |