Alvin W Czanderna
Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis - Methods of Surface Characterization Alvin W Czanderna 1st ed. Softcover of orig. ed. 1999 edition

Name: Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis - Methods of Surface Characterization
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Author: Alvin W Czanderna

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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis - Methods of Surface Characterization

Alvin W Czanderna

1st ed. Softcover of orig. ed. 1999 edition

The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.

449 pages, 70 black & white illustrations, biography

Medios de comunicación	Libros Paperback Book (Libro con tapa blanda y lomo encolado)
Publicado	6 de diciembre de 2010
ISBN13	9781441932990
Editores	Springer-Verlag New York Inc.
Páginas	430
Dimensiones	152 × 229 × 23 mm · 625 g
Lengua	Inglés
Editor	Czanderna, Alvin W.
Editor	Madey, Theodore E.
Editor	Powell, Cedric J.