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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems - IEEE Press Eishi H. Ibe 1.º edición
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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems - IEEE Press
Eishi H. Ibe
This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions.
296 pages
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 13 de febrero de 2015 |
| ISBN13 | 9781118479292 |
| Editores | John Wiley & Sons Inc |
| Páginas | 296 |
| Dimensiones | 175 × 249 × 20 mm · 599 g |
| Lengua | Inglés |
