Yield Simulation for Integrated Circuits - The Springer International Series in Engineering and Computer Science - D.M. Walker - Libros - Kluwer Academic Publishers - 9780898382440 - 30 de septiembre de 1987
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Yield Simulation for Integrated Circuits - The Springer International Series in Engineering and Computer Science 1987 edition

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Since only half the chip area would have redundancy, I was concerned that the increase in yield would not outweigh the increased costs of testing and redundancy programming. I wanted a simulator that would allow me to evaluate the yield of arbitrary redundant layouts, hence I termed such a simulator a layout or yield simulator.


209 pages, biography

Medios de comunicación Libros     Hardcover Book   (Libro con lomo y cubierta duros)
Publicado 30 de septiembre de 1987
ISBN13 9780898382440
Editores Kluwer Academic Publishers
Páginas 209
Dimensiones 156 × 234 × 14 mm   ·   512 g
Lengua Inglés  

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