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IDDQ Testing for CMOS and VLSI Rochit Rajsuman Unabridged edition
IDDQ Testing for CMOS and VLSI
Rochit Rajsuman
Provides coverage of IDDQ testing, including discussion of the correlation between physical defects and logical faults, and how IDDQ testing detects these defects. It should be useful as a reference for designers and test engineers.
200 pages, 91ill.
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 1995 |
| Fecha de lanzamiento original | 1994 |
| ISBN13 | 9780890067260 |
| Editores | Artech House Publishers |
| Páginas | 193 |
| Dimensiones | 158 × 230 × 17 mm · 399 g |
| Lengua | Inglés |
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