Recomienda este artículo a tus amigos:
Reliability and Degradation of Iii-v Opt Osamu Ueda
Reliability and Degradation of Iii-v Opt
Osamu Ueda
Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems.
372 pages, 1, black & white illustrations
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 30 de septiembre de 1996 |
| ISBN13 | 9780890066522 |
| Editores | Artech House Publishers |
| Páginas | 372 |
| Dimensiones | 156 × 234 × 22 mm · 648 g |
Mas por Osamu Ueda
Mostrar todoMere med samme udgiver
Ver todo de Osamu Ueda ( Ej. Hardcover Book y Paperback Book )