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Yield and Reliability in Microwave Circu Michael D. Meehan
Yield and Reliability in Microwave Circu
Michael D. Meehan
A reference for anyone involved with microwave design. It tackles the practical aspects of microwave statistical design and introduces statistical design techniques that encompass many different applications. This presentation focuses on two main example areas - microwave circuits and systems.
300 pages, 1, black & white illustrations
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 1 de diciembre de 1993 |
| ISBN13 | 9780890065273 |
| Editores | Artech House Publishers |
| Páginas | 300 |
| Dimensiones | 152 × 229 × 20 mm · 585 g |