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Microelectronic Reliability: Integrity a Emiliano Pollino
Microelectronic Reliability: Integrity a
Emiliano Pollino
A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi
556 pages, 1, black & white illustrations
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 1 de abril de 1989 |
| ISBN13 | 9780890063507 |
| Editores | Artech House Publishers |
| Páginas | 556 |
| Dimensiones | 161 × 235 × 41 mm · 1,09 kg |
| Editor | Pollino, Emiliano |