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Microelectronic Reliability Vol. I: Test Edward B. Hakim
Microelectronic Reliability Vol. I: Test
Edward B. Hakim
Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought
396 pages, 1, black & white illustrations
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 31 de enero de 1989 |
| ISBN13 | 9780890062845 |
| Editores | Artech House Publishers |
| Páginas | 396 |
| Dimensiones | 161 × 238 × 30 mm · 771 g |
| Editor | Hakim, Edward B. |