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Handbook of Silicon Semiconductor Metrology 1.º edición
Handbook of Silicon Semiconductor Metrology
Containing more than 300 equations and nearly 500 drawings, photographs, and micrographs, this reference surveys key areas such as optical measurements and in-line calibration methods. It describes cleanroom-based measurement technology used during the manufacture of silicon integrated circuits and covers model-based, overlay, and dopant dose.
896 pages
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 29 de junio de 2001 |
| ISBN13 | 9780824705060 |
| Editores | Taylor & Francis Inc |
| Páginas | 894 |
| Dimensiones | 185 × 257 × 49 mm · 1,65 kg |
| Lengua | Inglés |
| Editor | Diebold, Alain C. |