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Thermal-Aware Testing of Digital VLSI Circuits and Systems Chattopadhyay, Santanu (Department of Electronics and Electrical Communication Engineering, Indian Institute of Technology Kharagpur, West Bengal, India) 1.º edición
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Thermal-Aware Testing of Digital VLSI Circuits and Systems
Chattopadhyay, Santanu (Department of Electronics and Electrical Communication Engineering, Indian Institute of Technology Kharagpur, West Bengal, India)
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.
118 pages, 10 Illustrations, black and white
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 25 de abril de 2018 |
| ISBN13 | 9780815378822 |
| Editores | Taylor & Francis Inc |
| Páginas | 118 |
| Dimensiones | 225 × 145 × 14 mm · 296 g |
| Lengua | Inglés |
