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Testability Concepts for Digital Ics: the Macro Test Approach - Frontiers in Electronic Testing Frans P. M. Beenker 1995 edition
Testability Concepts for Digital Ics: the Macro Test Approach - Frontiers in Electronic Testing
Frans P. M. Beenker
Considering the testability aspects for digital ICs, this book integrates the testability aspects into the design and manufacturing of ICs and, for each IC design project, gives a precise definition of the boundary conditions, responsibilities, interfaces and communications between persons, and quality targets.
212 pages, biography
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 30 de noviembre de 1995 |
| ISBN13 | 9780792396581 |
| Editores | Kluwer Academic Publishers |
| Páginas | 212 |
| Dimensiones | 170 × 244 × 14 mm · 498 g |
| Lengua | Inglés |