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Electrical Characterization of Silicon-on-insulator Materials and Devices - the Springer International Series in Engineering and Computer Science Sorin Cristoloveanu 1995 edition
Electrical Characterization of Silicon-on-insulator Materials and Devices - the Springer International Series in Engineering and Computer Science
Sorin Cristoloveanu
Describes a variety of electrical characterization methods, from wafer screening and defect identification to detailed device evaluation. This book provides a comprehensive treatment of different aspects of SOI technologies, including material synthesis, device physics, characterization, circuit applications, and reliability issues.
396 pages, biography
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 30 de junio de 1995 |
| ISBN13 | 9780792395485 |
| Editores | Kluwer Academic Publishers |
| Páginas | 396 |
| Dimensiones | 156 × 234 × 22 mm · 734 g |
| Lengua | Inglés |
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