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Modeling of Electrical Overstress in Integrated Circuits - the Springer International Series in Engineering and Computer Science Carlos H. Diaz 1994 edition
Modeling of Electrical Overstress in Integrated Circuits - the Springer International Series in Engineering and Computer Science
Carlos H. Diaz
Electrical overstress (EOS) and Electrostatic discharge (ESD) pose as one of the threats to integrated circuits (ICs). This book analyzes the EOS/ESD-related failures in I/O protection devices in integrated circuits. This book is intended for VLSI designers, reliability engineers and those working on the development of EOS/ESD analysis tools.
148 pages, biography
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 30 de noviembre de 1994 |
| ISBN13 | 9780792395058 |
| Editores | Kluwer Academic Publishers |
| Páginas | 148 |
| Dimensiones | 156 × 234 × 11 mm · 394 g |
| Lengua | Inglés |