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Analog Layout Generation Performance and Manufacturability - the Springer International Series in Engineering and Computer Science Koen Lampaert 1999 edition
Analog Layout Generation Performance and Manufacturability - the Springer International Series in Engineering and Computer Science
Koen Lampaert
Outlines a criterion to quantify the detectability of a fault and combines this with a yield model to evaluate the testability of an integrated circuit layout. This book is intended for analog engineers, researchers and students.
190 pages, biography
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 30 de abril de 1999 |
| ISBN13 | 9780792384793 |
| Editores | Kluwer Academic Publishers |
| Páginas | 190 |
| Dimensiones | 155 × 235 × 12 mm · 453 g |
| Lengua | Inglés |