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Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits - Frontiers in Electronic Testing M. Bushnell 1st Corrected ed. 2002. Corr. 2nd printing 2004 edition
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits - Frontiers in Electronic Testing
M. Bushnell
The modern electronic testing has a forty year history. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook.
690 pages, biography
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 30 de noviembre de 2000 |
| ISBN13 | 9780792379911 |
| Editores | Kluwer Academic Publishers |
| Páginas | 690 |
| Dimensiones | 180 × 264 × 43 mm · 1,49 kg |
| Lengua | Inglés |