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Electrothermal Analysis of VLSI Systems Yi-Kan Cheng 2002 edition
Electrothermal Analysis of VLSI Systems
Yi-Kan Cheng
This useful book addresses electrothermal problems in modern VLSI systems. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis.
210 pages, 36 black & white illustrations, biography
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 30 de junio de 2000 |
| ISBN13 | 9780792378617 |
| Editores | Springer |
| Páginas | 210 |
| Dimensiones | 155 × 235 × 14 mm · 512 g |
| Lengua | Inglés |