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Defects in SiO2 and Related Dielectrics: Science and Technology - NATO Science Series II Gianfranco Pacchioni Softcover reprint of the original 1st ed. 2000 edition
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Defects in SiO2 and Related Dielectrics: Science and Technology - NATO Science Series II
Gianfranco Pacchioni
Proceedings of the NATO Advanced Study Institute, Erice, Italy, April 8-20, 2000
624 pages, 87 black & white illustrations, biography
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 31 de diciembre de 2000 |
| ISBN13 | 9780792366867 |
| Editores | Springer |
| Páginas | 624 |
| Dimensiones | 153 × 234 × 20 mm · 875 g |
| Lengua | Inglés |
| Editor | Griscom, David L. |
| Editor | Pacchioni, Gianfranco |
| Editor | Skuja, Linards |
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