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Electronic Thin-Film Reliability Tu, King-Ning (University of California, Los Angeles)
Electronic Thin-Film Reliability
Tu, King-Ning (University of California, Los Angeles)
Based on a graduate course at UCLA, this book describes reliability and failure of thin films. Beginning with core topics such as deposition and diffusion, the book fully explains irreversible processes with practical examples. Closing with failure analysis, this book is ideal for graduate students, researchers and practitioners.
412 pages, 186 b/w illus. 23 tables
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 25 de noviembre de 2010 |
| ISBN13 | 9780521516136 |
| Editores | Cambridge University Press |
| Páginas | 412 |
| Dimensiones | 180 × 254 × 23 mm · 957 g |
| Lengua | Inglés |