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Ionizing Radiation Effects in MOS Devices and Circuits TP Ma
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Ionizing Radiation Effects in MOS Devices and Circuits
TP Ma
The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process--induced radiation effects in the fabrication of high--density circuits.
608 pages, Ill.
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 18 de abril de 1989 |
| ISBN13 | 9780471848936 |
| Editores | John Wiley & Sons Inc |
| Páginas | 608 |
| Dimensiones | 169 × 245 × 34 mm · 948 g |
| Editor | Dressendorfer, Paul V. (Sandia National Laboratories, Albuquerque, New Mexico) |
| Editor | Ma, T. P. (Yale University) |
