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Semiconductor Material and Device Characterization - IEEE Press Schroder, Dieter K. (Arizona State University) 3.º edición
Semiconductor Material and Device Characterization - IEEE Press
Schroder, Dieter K. (Arizona State University)
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers.
800 pages, illustrations
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 17 de febrero de 2006 |
| ISBN13 | 9780471739067 |
| Editores | John Wiley & Sons Inc |
| Páginas | 800 |
| Dimensiones | 243 × 164 × 51 mm · 1,32 kg |
| Lengua | Inglés |