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Reliability Wearout Mechanisms in Advanced CMOS Technologies - IEEE Press Series on Microelectronic Systems Strong, Alvin W. (IBM)
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Reliability Wearout Mechanisms in Advanced CMOS Technologies - IEEE Press Series on Microelectronic Systems
Strong, Alvin W. (IBM)
This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.
624 pages, Illustrations
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 4 de septiembre de 2009 |
| ISBN13 | 9780471731726 |
| Editores | John Wiley & Sons Inc |
| Páginas | 640 |
| Dimensiones | 164 × 243 × 34 mm · 993 g |
| Lengua | Inglés |
