Recomienda este artículo a tus amigos:
Accelerated Testing: Statistical Models, Test Plans, and Data Analysis - Wiley Series in Probability and Statistics Nelson, Wayne B. (California Institute of Technology (Caltech); University of Illinois) 2 Revised edition
Precio
$ 165,49
sin IVA
Pedido desde almacén remoto
Entrega prevista 17 de jun. - 6 de jul.
Nuestros clientes opinan:
Añadir a tu lista de deseos de iMusic
Accelerated Testing: Statistical Models, Test Plans, and Data Analysis - Wiley Series in Probability and Statistics
Nelson, Wayne B. (California Institute of Technology (Caltech); University of Illinois)
Useful methodology has been developed in accelerated testing. This work deals with the topic Accelerated Testing: Statistical Models, Test Plans, and Data Analyses. It is useful for practitioners.
624 pages, black & white illustrations, figures
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 1 de diciembre de 2007 |
| Fecha de lanzamiento original | 2004 |
| ISBN13 | 9780471697367 |
| Editores | John Wiley & Sons Inc |
| Páginas | 624 |
| Dimensiones | 154 × 232 × 38 mm · 820 g |
| Lengua | Inglés |
