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Matching Properties of Deep Sub-Micron MOS Transistors - The Springer International Series in Engineering and Computer Science Jeroen A. Croon 2005 edition
Matching Properties of Deep Sub-Micron MOS Transistors - The Springer International Series in Engineering and Computer Science
Jeroen A. Croon
The model is illustrated by dimensioning the unit current cell of a current-steering D/A converter. The most commonly used methods to extract the matching properties of a technology are bench-marked with respect to model accuracy, measurement accuracy and speed, and physical contents of the extracted parameters.
218 pages, biography
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 24 de marzo de 2005 |
| ISBN13 | 9780387243146 |
| Editores | Springer-Verlag New York Inc. |
| Páginas | 206 |
| Dimensiones | 156 × 232 × 14 mm · 476 g |
| Lengua | Inglés |