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Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition, Lawrence E. Murr 2.º edición
Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition,
Lawrence E. Murr
The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr
856 pages
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 29 de octubre de 2019 |
| ISBN13 | 9780367402945 |
| Editores | Taylor & Francis Ltd |
| Páginas | 856 |
| Dimensiones | 150 × 220 × 10 mm · 453 g |
| Lengua | Inglés |
| Editor | Murr, Lawrence E |