Recomienda este artículo a tus amigos:
Advances in x-Ray Analysis: Proccedings of the Forty-Second Annual Conference on Applications of X-Ray Analysis Held in Denver, Colorado, August 2-6, John V. Gilfrich (Sachs / Freeman Associates / NRL, Washington, DC, USA) 1.º edición
Advances in x-Ray Analysis: Proccedings of the Forty-Second Annual Conference on Applications of X-Ray Analysis Held in Denver, Colorado, August 2-6,
John V. Gilfrich (Sachs / Freeman Associates / NRL, Washington, DC, USA)
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 30 de septiembre de 1994 |
| ISBN13 | 9780306449017 |
| Editores | Kluwer Academic Publishers Group |
| Páginas | 778 |
| Dimensiones | 264 × 184 × 47 mm · 1,59 kg |
| Lengua | Inglés |
| Editor | C.C. Goldsmith |
| Editor | I. Cev Noyan (IBM Research Center, Yorktown Heights, NY, USA) |
| Editor | Ron Jenkins (International Centre for Diffraction Data, Newton Square, Pennsylvania, USA) |
| Editor | Ting C. Huang (IBM Almaden Research Center, San Jose, CA, USA) |