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Ion Spectroscopies for Surface Analysis - Methods of Surface Characterization 1991 edition
Ion Spectroscopies for Surface Analysis - Methods of Surface Characterization
Determining the elemental composition of surfaces is an essential measurement in characterizing solid surfaces. Typically, atoms and molecules on the surface and in the near surface region may be excited by photons, electrons, ions, or neutrals, and the detected particles are emitted, ejected, or scattered ions or electrons.
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 30 de septiembre de 1991 |
| ISBN13 | 9780306437922 |
| Editores | Kluwer Academic Publishers Group |
| Páginas | 469 |
| Dimensiones | 150 × 220 × 20 mm · 889 g |
| Editor | Czanderna, Alvin W. |
| Editor | Hercules, David M. |