Defect and Microstructure Analysis by Diffraction - International Union of Crystallography Monographs on Crystallography - Robert L. Snyder - Libros - Oxford University Press - 9780198501893 - 16 de marzo de 2000
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Defect and Microstructure Analysis by Diffraction - International Union of Crystallography Monographs on Crystallography

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Examines the state of the art for determining the "real" structure of matter. This book provides an analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns. It presents the principal characterization technique permitting us to measure the defect solid state: X-ray diffraction.


808 pages, numerous line figures

Medios de comunicación Libros     Hardcover Book   (Libro con lomo y cubierta duros)
Publicado 16 de marzo de 2000
ISBN13 9780198501893
Editores Oxford University Press
Páginas 808
Dimensiones 164 × 238 × 49 mm   ·   1,30 kg
Lengua Inglés  
Editor Bunge, Hans J (Department of Physical Metallurgy, Department of Physical Metallurgy, Technical University of Clausthal, Germany)
Editor Fiala, Jaroslav (Department of Metallurgy, Department of Metallurgy, Central Research Institute Skoda, Czech Republic)
Editor Snyder, Robert (, Department of Materials Science and Engineering, Columbus, USA)

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