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Defect and Microstructure Analysis by Diffraction - International Union of Crystallography Monographs on Crystallography Robert L. Snyder
Defect and Microstructure Analysis by Diffraction - International Union of Crystallography Monographs on Crystallography
Robert L. Snyder
Examines the state of the art for determining the "real" structure of matter. This book provides an analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns. It presents the principal characterization technique permitting us to measure the defect solid state: X-ray diffraction.
808 pages, numerous line figures
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 6 de enero de 2000 |
| ISBN13 | 9780198501893 |
| Editores | Oxford University Press |
| Páginas | 808 |
| Dimensiones | 164 × 238 × 49 mm · 1,29 kg |
| Lengua | Inglés |
| Editor | Bunge, Hans J (Department of Physical Metallurgy, Department of Physical Metallurgy, Technical University of Clausthal, Germany) |
| Editor | Fiala, Jaroslav (Department of Metallurgy, Department of Metallurgy, Central Research Institute Skoda, Czech Republic) |
| Editor | Snyder, Robert (, Department of Materials Science and Engineering, Columbus, USA) |