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Reliability Prediction from Burn-In Data Fit to Reliability Models Bernstein, Joseph (Ariel University, Ariel, Israel.)
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Reliability Prediction from Burn-In Data Fit to Reliability Models
Bernstein, Joseph (Ariel University, Ariel, Israel.)
Helps you educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level.
108 pages, black & white illustrations
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 21 de marzo de 2014 |
| ISBN13 | 9780128007471 |
| Editores | Elsevier Science Publishing Co Inc |
| Páginas | 108 |
| Dimensiones | 154 × 228 × 6 mm · 154 g |
