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Advances in Imaging and Electron Physics: Theory of Intense Beams of Charged Particles - Advances in Imaging and Electron Physics
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Advances in Imaging and Electron Physics: Theory of Intense Beams of Charged Particles - Advances in Imaging and Electron Physics
Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in these domains.
752 pages
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 21 de junio de 2011 |
| ISBN13 | 9780123813107 |
| Editores | Elsevier Science Publishing Co Inc |
| Páginas | 752 |
| Dimensiones | 152 × 229 × 40 mm · 1,17 kg |
| Lengua | Inglés |
| Editor de series | Hawkes, Peter W. (Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics) |
